This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.

In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics.

It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

Part I: Technical aspects

Experimental technique and working modes
Dissipation KPFM
KPFM techniques for liquid environment
Open-loop and excitation KPFM
Quantitative KPFM on semiconductor devices
KPFM with atomic resolution
KPFM with atomic resolution
Part II: Theoretical Aspects
Local dipoles in atomic and Kelvin probe force microscopy
Influence of the tip electrostatic field on high resolution KPFM measurements
Modelling the electrostatic field of a cantilever
Theory of open-loop KPFM
KPFM in a SPM simulator
Electrostatic interactions with dielectric samples
Part III: Applications
Kelvin spectroscopy of single molecules
KPFM for single molecule chemistry
Optoelectronic properties of single molecules
Quantitative KPFM of molecular self-assemblies
Applications of KPFM in liquids
KPFM of organic solar cell materials
Correlation of optical and electrical nanoscale properties of organic devices
KPFM for catalysis
Quantitative electrical measurements of SiC devices.