This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

Introduction

Part I: Scanning Probe Microscopy Instrumentation
Harmonic Oscillator
Technical Aspects of Scanning Probe Microscopy
Scanning Probe Microscopy Designs
Electronics for Scanning Probe Microscopy
Lock-In Technique
Data Representation and Image Processing
Artifacts in SPM
Work Function, Contact Potential, and Kelvin Probe
Part II: Atomic Force Microscopy (AFM)
Forces between Tip and Sample
Technical Aspects of Atomic Force Microscopy
Static Atomic Force Microscopy
Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
Intermittent Contact Mode/Tapping Mode
Mapping of Mechanical Properties Using Force-Distance
Frequency Modulation (FM) Mode in Dynamic Atomic Force
Noise in Atomic Force Microscopy
Quartz Sensors in Atomic Force Microscopy.