Characterization of Condensed Matter

An Introduction to Composition, Microstructure, and Surface Methods

Characterization of Condensed Matter

An Introduction to Composition, Microstructure, and Surface Methods

109,00 €*

in Vorbereitung

Ein umfassendes Buch, in dem wesentliche Techniken zur Charakterisierung der Struktur und Zusammensetzung kondensierter Materie sowie die jeweiligen Grundlagen, benötigten Instrumente und möglichen Anwendungen dargestellt sind.

PART I. Fundamental of Universe, Matter, Condensed Matter and CrystallographyChapter 1. Universe, Matter, Condensed Matter and MaterialsChapter 2. Laser Interferometer Gravitational Wave ObservatoryChapter 3. Fundamentals of Crystallography for Microstructure Characterization of Condensed MatterPART II. Electromagnetic SpectroscopyChapter 4. Element of X-Ray DiffractionChapter 5. X-Ray Fluorescence Spectroscopy (XRF)Chapter 6. X-Ray Emission Spectroscopy (XES)Chapter 7. X-Ray Absorption Spectroscopy (XAS): X-Ray Absorption Near Edge Structure (XANES) and Extended X-Ray Absorption Fine Structure (EXAFS)Chapter 8. X-Ray Raman Scattering (XRS(Chapter 9. Fourier Transform Infrared Spectroscopy (FTIR)Chapter 10. Energy Dispersive X-Ray Spectrum of Elements (EDX)PART III. Characterization Methods Based on the Particle (Electron or Electron Beam, Neutron)-Matter InteractionChapter 11. Scanning Electron Microscope (SEM)Chapter 12. Transmission Electron Microscope (TEM)Chapter 13. Spherical Aberration Corrected Transmission Electron Microscope (SAC-TEM)Chapter 14. Environmental Transmission Electron Microscope (ETEM)Chapter 15. HolographyPART IV. Characterization Methods for Hyperfine Structures Related to the Magnetic Properties of Electrons and NucleiChapter 16. Nuclear Magnetic Resonance SpectroscopyChapter 17. Mössbauer Effect and Mössbauer SpectroscopyPART V. Surface Analysis MethodChapter 18. Atomic Force Microscope (AFM)Chapter 19. X-Ray Photoelectron Spectroscopy (XPS)PART VI. Some Progress and PerspectiveChapter 20. Instrumentation Based on Fundamental Progress in Interaction Electromagnetic Wave and Matter, and Electron-Matter Interaction
ISBN 9783527351091
Artikelnummer 9783527351091
Medientyp Buch
Copyrightjahr 2023
Verlag Wiley-VCH
Umfang 368 Seiten
Abbildungen 19 SW-Abb., 122 Farbabb., 9 Tabellen
Sprache Englisch